Structural effects on exchange in nanocluster perpendicular recording media

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Recording performances in perpendicular magnetic patterned media

We report on the recording performances and signal-to-noise ratio analyses of perpendicular magnetic bit-patterned media. Two different types of magnetic samples are investigated. They differ by the way that they were patterned (nano-imprint versus e-beam lithography) as well as their magnetic properties (Co/Pt multilayers and CoCrPt alloy are the recording layers). By using a contact read/writ...

متن کامل

Magnetic Layers for Perpendicular Recording Media

Hard disk drives (HDDs) are recently being incorporated into video recorders, car navigation devices, family game machines, etc., as devices (AV-HDDs) to store digital AV (audio-visual) information such as movies and television programs. Because the AV-HDD has the features of large capacity, high speed and low cost, it is suitable for long-time recording, high-speed random access and multi-chan...

متن کامل

Iterative Method for Intrinsic Viscosity Measurements on Perpendicular Recording Media

In this paper, we introduce a new method that allows to directly measure the intrinsic viscosity ( ) for perpendicular media using a vibrating sample magnetometer. The measurement is carried out in a number of iterations. In each iteration, the behavior of applied field ( ) with time is gradually adjusted according to the change in the internal field ( ) calculated from the relaxation behavior ...

متن کامل

Magnetic Nanoparticle Arrays Self-Assembled on Perpendicular Magnetic Recording Media

We study magnetic-field directed self-assembly of magnetic nanoparticles onto templates recorded on perpendicular magnetic recording media, and quantify feature width and height as a function of assembly time. Feature widths are determined from Scanning Electron Microscope (SEM) images, while heights are obtained with Atomic Force Microscopy (AFM). For short assembly times, widths were ~150 nm,...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Journal of Applied Physics

سال: 2006

ISSN: 0021-8979,1089-7550

DOI: 10.1063/1.2177423